过氧化氢 30% Stabilised, CMOS microelectronic use, J.T.Baker®

供应商: Avantor
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BAKR2201-54EA 0 CNY
BAKR2201-54 BAKR2201-T2 BAKR2201-T4 BAKR2201-T8 BAKR2201-T9
过氧化氢 30% Stabilised, CMOS microelectronic use, J.T.Baker®
过氧化氢
分子式: H₂O₂
分子量: 34.01 g/mol
沸点: 150.2
溶点: -0.41
密度: 1.11
MDL编号: MFCD00011333
CAS号: 7722-84-1
UN号: 2014
ADR: 5.1 II
Merck Index: 14,04798

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产品技术规格

For Microelectronic Use
Assay (H₂O₂) 31.52 - 31.72 %
Free Acid (µeq/g) ≤0.2
Residue after Evaporation ≤10 ppm
Ammonium (NH₄) ≤3 ppm
Chloride (Cl) ≤0.2 ppm
Nitrate (NO₃) ≤2 ppm
Phosphate (PO₄) ≤1 ppm
Sulfate (SO₄) ≤3 ppm
Trace Impurities - Aluminum (Al) ≤47.550 ppb
Trace Impurities - Antimony (Sb) ≤10.000 ppb
Trace Impurities - Arsenic (As) ≤10.000 ppb
Arsenic and Antimony (as As) ≤10.0 ppb
Trace Impurities - Barium (Ba) ≤6.870 ppb
Trace Impurities - Beryllium (Be) ≤10.000 ppb
Trace Impurities - Bismuth (Bi) ≤20.000 ppb
Trace Impurities - Boron (B) ≤6.200 ppb
Trace Impurities - Cadmium (Cd) ≤10.000 ppb
Trace Impurities - Calcium (Ca) ≤10.080 ppb
Trace Impurities - Chromium (Cr) ≤4.930 ppb
Trace Impurities - Cobalt (Co) ≤2.000 ppb
Trace Impurities - Copper (Cu) ≤1.680 ppb
Trace Impurities - Gallium (Ga) ≤20.000 ppb
Trace Impurities - Germanium (Ge) ≤10.000 ppb
Trace Impurities - Gold (Au) ≤10.000 ppb
Heavy Metals (as Pb) ≤500.0 ppb
Trace Impurities - Iron (Fe) ≤13.470 ppb
Trace Impurities - Lead (Pb) ≤2.430 ppb
Trace Impurities - Lithium (Li) ≤1.920 ppb
Trace Impurities - Magnesium (Mg) ≤5.230 ppb
Trace Impurities - Manganese (Mn) ≤1.560 ppb
Trace Impurities - Molybdenum (Mo) ≤10.000 ppb
Trace Impurities - Nickel (Ni) ≤3.260 ppb
Trace Impurities - Niobium (Nb) ≤10.000 ppb
Trace Impurities - Potassium (K) ≤850.000 ppb
Trace Impurities - Silicon (Si) ≤100.000 ppb
Trace Impurities - Silver (Ag) ≤10.000 ppb
Trace Impurities - Sodium (Na) ≤39.700 ppb
Trace Impurities - Strontium (Sr) ≤10.000 ppb
Trace Impurities - Tantalum (Ta) ≤10.000 ppb
Color (APHA) ≤10
Particle count at point of fill - 0.1 µm and higher (RION KS42A) ≤23129.3 par/ml
Particle count at point of fill - 0.2 µm and higher (RION KS42A) ≤1596.8 par/ml
Particle count at point of fill - 0.5 µm and higher (RION KS42A) ≤350.0 par/ml


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